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Topic B. - Hardware
  
  B.0Topic B.0 - GENERAL(Referees: Moreno E.)
 
B.1Topic B.1 - CONTROL STRUCTURES AND MICROPROGRAMMING(Referees: Bergstra J.)
 
 
      
      B.1.0Topic B.1.0 - General
B.1.1Topic B.1.1 - Control Design Styles(Referees: Nedjah N.)
B.1.2Topic B.1.2 - Control Structure Performance Analysis and Design Aids
B.1.3Topic B.1.3 - Control Structure Reliability, Testing, and Fault-Tolerance
B.1.4Topic B.1.4 - Microprogram Design Aids
B.1.5Topic B.1.5 - Microcode Applications
B.1.mTopic B.1.m - Miscellaneous
B.2Topic B.2 - ARITHMETIC AND LOGIC STRUCTURES(Referees: Keller J., Moreno E.)
 
 
      
      B.2.0Topic B.2.0 - General
B.2.1Topic B.2.1 - Design Styles
B.2.2Topic B.2.2 - Performance Analysis and Design Aids(Referees: Gómez-Pulido J.)
B.2.3Topic B.2.3 - Reliability, Testing, and Fault-Tolerance
B.2.4Topic B.2.4 - High-Speed Arithmetic(Referees: Gómez-Pulido J., Nedjah N., Rodríguez-Henríquez F., Steinwandt R.)
B.2.mTopic B.2.m - Miscellaneous
B.3Topic B.3 - MEMORY STRUCTURES(Referees: Moreno E.)
 
 
      
      B.3.0Topic B.3.0 - General
B.3.1Topic B.3.1 - Semiconductor Memories
B.3.2Topic B.3.2 - Design Styles
B.3.3Topic B.3.3 - Performance Analysis and Design Aids
B.3.4Topic B.3.4 - Reliability, Testing, and Fault-Tolerance
B.3.mTopic B.3.m - Miscellaneous
B.4Topic B.4 - INPUT/OUTPUT AND DATA COMMUNICATIONS
 
      
      B.4.0Topic B.4.0 - General
B.4.1Topic B.4.1 - Data Communications Devices(Referees: McAllister G., Wendzel S.)
B.4.2Topic B.4.2 - Input/Output Devices
B.4.3Topic B.4.3 - Interconnections (Subsystems)(Referees: Nedjah N.)
B.4.4Topic B.4.4 - Performance Analysis and Design Aids
B.4.5Topic B.4.5 - Reliability, Testing, and Fault-Tolerance
B.4.mTopic B.4.m - Miscellaneous
B.5Topic B.5 - REGISTER-TRANSFER-LEVEL IMPLEMENTATION(Referees: Sima D.)
 
 
      
      B.5.0Topic B.5.0 - General
B.5.1Topic B.5.1 - Design(Referees: Damaševičius R., Nedjah N.)
B.5.2Topic B.5.2 - Design Aids
B.5.3Topic B.5.3 - Reliability and Testing(Referees: Wotawa F.)
B.5.mTopic B.5.m - Miscellaneous
B.6Topic B.6 - LOGIC DESIGN(Referees: Gómez-Pulido J., Moreno E.)
 
 
      
      B.6.0Topic B.6.0 - General
B.6.1Topic B.6.1 - Design Styles(Referees: Nedjah N.)
B.6.2Topic B.6.2 - Reliability and Testing(Referees: Wotawa F.)
B.6.3Topic B.6.3 - Design Aids
B.6.mTopic B.6.m - Miscellaneous
B.7Topic B.7 - INTEGRATED CIRCUITS
 
      
      B.7.0Topic B.7.0 - General
B.7.1Topic B.7.1 - Types and Design Styles
B.7.2Topic B.7.2 - Design Aids
B.7.3Topic B.7.3 - Reliability and Testing
B.7.mTopic B.7.m - Miscellaneous
B.8Topic B.8 - PERFORMANCE AND RELIABILITY(Referees: Nardone R.)
 
 
      
      B.8.0Topic B.8.0 - General
B.8.1Topic B.8.1 - Reliability, Testing, and Fault-Tolerance(Referees: Wotawa F.)
B.8.2Topic B.8.2 - Performance Analysis and Design Aids
B.8.mTopic B.8.m - Miscellaneous
B.mTopic B.m - MISCELLANEOUS
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