Topic B. - Hardware
(Referees: Posch R.)
- B.0
- Topic B.0 - GENERAL
(Referees: Al-Rabadi A., Moreno E.)
- B.1
- Topic B.1 - CONTROL STRUCTURES AND MICROPROGRAMMING
(Referees: Al-Rabadi A., Bergstra J., Velev M. N.)
- B.1.0
- Topic B.1.0 - General
- B.1.1
- Topic B.1.1 - Control Design Styles
(Referees: Nedjah N.)
- B.1.2
- Topic B.1.2 - Control Structure Performance Analysis and Design Aids
- B.1.3
- Topic B.1.3 - Control Structure Reliability, Testing, and Fault-Tolerance
- B.1.4
- Topic B.1.4 - Microprogram Design Aids
- B.1.5
- Topic B.1.5 - Microcode Applications
- B.1.m
- Topic B.1.m - Miscellaneous
- B.2
- Topic B.2 - ARITHMETIC AND LOGIC STRUCTURES
(Referees: Al-Rabadi A., Bode A., Keller J., Moreno E., Muller J.-M.)
- B.2.0
- Topic B.2.0 - General
- B.2.1
- Topic B.2.1 - Design Styles
- B.2.2
- Topic B.2.2 - Performance Analysis and Design Aids
(Referees: Gómez-Pulido J.)
- B.2.3
- Topic B.2.3 - Reliability, Testing, and Fault-Tolerance
(Referees: Jürgensen H.)
- B.2.4
- Topic B.2.4 - High-Speed Arithmetic
(Referees: Gómez-Pulido J., Nedjah N., Rodríguez-Henríquez F., Steinwandt R.)
- B.2.m
- Topic B.2.m - Miscellaneous
- B.3
- Topic B.3 - MEMORY STRUCTURES
(Referees: Al-Rabadi A., Moreno E., Velev M. N.)
- B.3.0
- Topic B.3.0 - General
- B.3.1
- Topic B.3.1 - Semiconductor Memories
- B.3.2
- Topic B.3.2 - Design Styles
- B.3.3
- Topic B.3.3 - Performance Analysis and Design Aids
(Referees: Tragoudas S.)
- B.3.4
- Topic B.3.4 - Reliability, Testing, and Fault-Tolerance
(Referees: Jürgensen H.)
- B.3.m
- Topic B.3.m - Miscellaneous
- B.4
- Topic B.4 - INPUT/OUTPUT AND DATA COMMUNICATIONS
(Referees: Al-Rabadi A., Carballo J.-A.)
- B.4.0
- Topic B.4.0 - General
- B.4.1
- Topic B.4.1 - Data Communications Devices
(Referees: McAllister G.)
- B.4.2
- Topic B.4.2 - Input/Output Devices
- B.4.3
- Topic B.4.3 - Interconnections (Subsystems)
(Referees: Nedjah N.)
- B.4.4
- Topic B.4.4 - Performance Analysis and Design Aids
- B.4.5
- Topic B.4.5 - Reliability, Testing, and Fault-Tolerance
(Referees: Jürgensen H.)
- B.4.m
- Topic B.4.m - Miscellaneous
- B.5
- Topic B.5 - REGISTER-TRANSFER-LEVEL IMPLEMENTATION
(Referees: Al-Rabadi A., Sima D., Velev M. N.)
- B.5.0
- Topic B.5.0 - General
- B.5.1
- Topic B.5.1 - Design
(Referees: Damaševičius R., Nedjah N.)
- B.5.2
- Topic B.5.2 - Design Aids
- B.5.3
- Topic B.5.3 - Reliability and Testing
(Referees: Jürgensen H., Wotawa F.)
- B.5.m
- Topic B.5.m - Miscellaneous
- B.6
- Topic B.6 - LOGIC DESIGN
(Referees: Al-Rabadi A., Dvořák V., Gómez-Pulido J., Molitor P., Moreno E., Velev M. N.)
- B.6.0
- Topic B.6.0 - General
(Referees: Tabakow I.)
- B.6.1
- Topic B.6.1 - Design Styles
(Referees: Nedjah N.)
- B.6.2
- Topic B.6.2 - Reliability and Testing
(Referees: Jürgensen H., Tragoudas S., Wotawa F.)
- B.6.3
- Topic B.6.3 - Design Aids
(Referees: Tragoudas S.)
- B.6.m
- Topic B.6.m - Miscellaneous
- B.7
- Topic B.7 - INTEGRATED CIRCUITS
(Referees: Al-Rabadi A.)
- B.7.0
- Topic B.7.0 - General
(Referees: Tragoudas S.)
- B.7.1
- Topic B.7.1 - Types and Design Styles
(Referees: Tragoudas S.)
- B.7.2
- Topic B.7.2 - Design Aids
(Referees: Tragoudas S.)
- B.7.3
- Topic B.7.3 - Reliability and Testing
(Referees: Jürgensen H., Tragoudas S.)
- B.7.m
- Topic B.7.m - Miscellaneous
(Referees: Tragoudas S.)
- B.8
- Topic B.8 - PERFORMANCE AND RELIABILITY
(Referees: Al-Rabadi A., Molitor P.)
- B.8.0
- Topic B.8.0 - General
- B.8.1
- Topic B.8.1 - Reliability, Testing, and Fault-Tolerance
(Referees: Nagar A., Tabakow I., Wotawa F.)
- B.8.2
- Topic B.8.2 - Performance Analysis and Design Aids
- B.8.m
- Topic B.8.m - Miscellaneous
- B.m
- Topic B.m - MISCELLANEOUS
(Referees: Al-Rabadi A., Tragoudas S.)
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